Description

Layer thickness measuring instrument Leptoskop® Design: Versatile layer thickness measuring instrument with external probe, precise measuring technology and the possibility of fast on-site extension via enabling codes (software modules "Statistics" and "Data storage"). Large, backlit graphics display (48 x 24 mm), large selection of probes. Measurement range 0-20000 µm (dependent on probes), 10 selectable languages, USB/RS232 interface and rubber protective frame. Battery lifetime approx. 100 hours. Supplied with Fe probe to 5000 µm, control body, set of calibration foils, operating instructions, acceptance protocol/quality test certificate, measurement protocol, specialist literature and 2 Mignon batteries AA/LR06, 1.5 V, in plastic case. Measuring uncertainty (after calibration): Layer thickness < 100 µm: 1 % of the measurement value ± 1 µm Layer thickness > 100 µm: 1–3 % of the measurement value ± 1 µm Layer thickness > 1000 µm: 3–5 % of the measurement value ± 10 µm Layer thickness > 10000 µm: 5 % of the measurement value ± 100 µm Application: Determines the thickness of non-magnetic layers on magnetisable substrate (Fe, acc. to DIN EN ISO 2178) and the thickness of non-conductive layers on conductive base materials acc. to the eddy-current principle (NFe, acc. DIN EN ISO 2360).